| 1 |
Testing the mid-latitude hydrologic seesaw Reply
Jo KN, Woo KS, Yi S, Yang DY, Lim HS, Wang YJ, Cheng H, Edwards RL
Nature, 526(7571), E2, 2015 |
| 2 |
Mid-latitude interhemispheric hydrologic seesaw over the past 550,000 years
Jo KN, Woo KS, Yi S, Yang DY, Lim HS, Wang YJ, Cheng H, Edwards RL
Nature, 508(7496), 378, 2014 |
| 3 |
Apigeninidin induces apoptosis through activation of Bak and Bax and subsequent mediation of mitochondrial damage in human promyelocytic leukemia HL-60 cells
Woo HJ, Oh IT, Lee JY, Jun DY, Seu MC, Woo KS, Nam MH, Kim YH
Process Biochemistry, 47(12), 1861, 2012 |
| 4 |
다축-다변량회귀분석 기법을 이용한 회분식 공정의 이상감지 및 통계적 제어 방법
우경섭, 이창준, 한경훈, 고재욱, 윤인섭
Korean Chemical Engineering Research, 45(1), 32, 2007 |
| 5 |
Method of measuring charge distribution of nanosized aerosols
Kim SH, Woo KS, Liu BYH, Zachariah MR
Journal of Colloid and Interface Science, 282(1), 46, 2005 |
| 6 |
Aging and cold crystallization of melt-extruded poly(trim ethylene terephthalate) films
Cho JW, Woo KS
Journal of Polymer Science Part B: Polymer Physics, 39(16), 1920, 2001 |
| 7 |
Comparison of the submicron particle analysis capabilities of Auger electron spectroscopy, time-of-flight secondary ion mass spectrometry, and scanning electron microscopy with energy dispersive x-ray spectroscopy for particles deposited on silicon wafers with 1 mu m thick oxide layers
Diebold AC, Lindley P, Viteralli J, Kingsley J, Liu BYH, Woo KS
Journal of Vacuum Science & Technology A, 16(3), 1825, 1998 |
| 8 |
Comparison of the submicron particle analysis capabilities of Auger electron spectroscopy, time-of-flight secondary ion mass spectrometry, and scanning electron microscopy with energy dispersive x-ray spectroscopy for particles deposited on silicon wafers with one micron thick oxide layers (vol 16, pg 1825, 1998)
Diebold AC, Lindley P, Viteralli J, Kingsley J, Liu BYH, Woo KS
Journal of Vacuum Science & Technology A, 16(5), 3148, 1998 |
| 9 |
폴리우레탄 탄성체 제조를 위한 Pilot 규모 회분식 중합 반응기에서의 점성 제어
우기수, 강신춘, 노시태
Applied Chemistry, 1(2), 690, 1997 |
| 10 |
Measurement of Silicon Particles by Laser-Surface Scanning and Angle-Resolved Light-Scattering
Huff HR, Goodall RK, Williams E, Woo KS, Liu BY, Warner T, Hirleman D, Gildersleeve K, Bullis WM, Scheer BW, Stover J
Journal of the Electrochemical Society, 144(1), 243, 1997 |
