검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
An ellipsometric method for the determination of the dielectric tensor of an optically uniaxial material suited for in-situ measurements Xu W, Wood LT, Golding TD Thin Solid Films, 384(2), 276, 2001 |
| No. | Article |
|---|---|
| 1 |
An ellipsometric method for the determination of the dielectric tensor of an optically uniaxial material suited for in-situ measurements Xu W, Wood LT, Golding TD Thin Solid Films, 384(2), 276, 2001 |