검색결과 : 10건
| No. | Article |
|---|---|
| 1 |
Double matrix effect in Low Energy Ion Scattering from La surfaces Zameshin AA, Yakshin AE, Sturm JM, Brongerma HH, Bijkerk F Applied Surface Science, 440, 570, 2018 |
| 2 |
Interactions of C in layered Mo-Si structures Bosgra J, Veldhuizen LW, Zoethout E, Verhoeven J, Loch RA, Yakshin AE, Bijkerk F Thin Solid Films, 542, 210, 2013 |
| 3 |
Non-constant diffusion characteristics of nanoscopic Mo-Si interlayer growth Bosgra J, Verhoeven J, van de Kruijs RWE, Yakshin AE, Bijkerk F Thin Solid Films, 522, 228, 2012 |
| 4 |
In-situ study of the diffusion-reaction mechanism in Mo/Si multilayered films Bruijn S, van de Kruijs RWE, Yakshin AE, Bijkerk F Applied Surface Science, 257(7), 2707, 2011 |
| 5 |
Reduction of interlayer thickness by low-temperature deposition of Mo/Si multilayer mirrors for X-ray reflection de Rooij-Lohmann VITA, Yakshin AE, Zoethout E, Verhoeven J, Bijkerk F Applied Surface Science, 257(14), 6251, 2011 |
| 6 |
Roughness evolution of Si surfaces upon Ar ion erosion de Rooij-Lohmann VITA, Kozhevnikov IV, Peverini L, Ziegler E, Cuerno R, Bijkerk F, Yakshin AE Applied Surface Science, 256(16), 5011, 2010 |
| 7 |
Nano-size crystallites in Mo/Si multilayer optics van de Kruijs RWE, Zoethout E, Yakshin AE, Nedelcu I, Louis E, Enkisch H, Sipos G, Mullender S, Bijkerk F Thin Solid Films, 515(2), 430, 2006 |
| 8 |
Interface roughness in Mo/Si multilayers Nedelcu I, de Kruijs RWEV, Yakshin AE, Tichelaar F, Zoethout E, Louis E, Enkisch H, Muellender S, Bijkerk F Thin Solid Films, 515(2), 434, 2006 |
| 9 |
Determination of crystallization as a function of Mo layer thickness in Mo/Si multilayers Abdali S, Gerward L, Yakshin AE, Louis E, Bijkerk F Materials Research Bulletin, 37(2), 279, 2002 |
| 10 |
Peak and Integrated reflectivity, wavelength and gamma optimization of Mo/Si, and Mo/Be multilayer, multielement optics for extreme ultraviolet lithography Stuik R, Louis E, Yakshin AE, Gorts PC, Maas ELG, Bijkerk F, Schmitz D, Scholze F, Ulm G, Haidl M Journal of Vacuum Science & Technology B, 17(6), 2998, 1999 |