1 |
Effect of buffer layer on VOx film fabrication by reactive RF sputtering Miyazaki H, Yasui I Applied Surface Science, 252(23), 8367, 2006 |
2 |
Structural study of amorphous In2O3 film by grazing incidence X-ray scattering (GIXS) with synchrotron radiation Utsuno F, Inoue H, Yasui I, Shimane Y, Tomai S, Matsuzaki S, Inoue K, Hirosawa I, Sato M, Honma T Thin Solid Films, 496(1), 95, 2006 |
3 |
Design of ITO/transparent resin optically selective transparent composite Miyazaki H, Ota T, Yasui I Solar Energy Materials and Solar Cells, 79(1), 51, 2003 |
4 |
AFM observation of the SnO2(110) bunching step structure formed in high-temperature LPE growth Kawamura F, Takahashi T, Utsuno F, Yasui I Journal of Crystal Growth, 244(2), 173, 2002 |
5 |
Investigations on the growth and morphology of TiO2 in the TiO2-Na2B4O7 system with and without impurities using a new LPE method Kawamura F, Yasui I, Sunagawa I Journal of Crystal Growth, 231(1-2), 186, 2001 |
6 |
Impurity effect on < 111 > and < 110 > directions of growing SnO2 single crystals in SnO2-CU2O flux System Kawamura F, Takahashi T, Yasui I, Sunagawa I Journal of Crystal Growth, 233(1-2), 259, 2001 |
7 |
Effects of supersaturation and impurity on step advancement on TiO2 (110) faces grown from high-temperature solution Kawamura F, Yasui I, Sunagawa I Journal of Crystal Growth, 233(3), 517, 2001 |
8 |
Habit modifications of SnO2 crystals in SnO2-Cu2O flux system in the presence of trivalent impurity cations Kawamura F, Yasui I, Kamei M, Sunagawa I Journal of the American Ceramic Society, 84(6), 1341, 2001 |
9 |
Origin of the crystalline orientation dependence of the electrical properties in tin-doped indium oxide films Kamei M, Enomoto H, Yasui I Thin Solid Films, 392(2), 265, 2001 |
10 |
Electrochemical evaluation of oriented vanadium oxide films deposited by reactive rf magnetron sputtering Miyazaki H, Sakamura H, Kamei M, Yasui I Solid State Ionics, 122(1-4), 223, 1999 |