| 1 |
Formation of single-crystal Cu2O strips in non-singlecrystal CuO thin films by continuous-wave laser diode with micro-chevron laser beam (mu-CLB)
Giraldo B, Yeh WC, Kobayashi NP
Journal of Materials Science, 55(29), 14105, 2020 |
| 2 |
Selective growth of single-grain crystal in Al thin film by micron chevron-shaped laser beam scanning
Pham AH, Yeh WC, Morito S, Ohba T
Thin Solid Films, 672, 100, 2019 |
| 3 |
Parameters extraction of solar cell models using a modified simplified swarm optimization algorithm
Lin PJ, Cheng SY, Yeh WC, Chen ZC, Wu LJ
Solar Energy, 144, 594, 2017 |
| 4 |
G-protein-coupled receptor GPR21 knockout mice display improved glucose tolerance and increased insulin response
Gardner J, Wu S, Ling L, Danao J, Li Y, Yeh WC, Tian H, Baribault H
Biochemical and Biophysical Research Communications, 418(1), 1, 2012 |
| 5 |
Planar ultracapacitors of miniature interdigital electrode loaded with hydrous RuO2 and RuO2 nanorods
Liu CC, Tsai DS, Susanti D, Yeh WC, Huang YS, Liu FJ
Electrochimica Acta, 55(20), 5768, 2010 |
| 6 |
Removal of cesium ions from aqueous solution by adsorption onto local Taiwan laterite
Wang TH, Li MH, Yeh WC, Wei YY, Teng SP
Journal of Hazardous Materials, 160(2-3), 638, 2008 |
| 7 |
Effects of Si film thickness and substrate temperature on melt duration observed in excimer laser-induced crystallization of amorphous Si thin films using in-situ transient reflectivity measurements
Kuo CC, Yeh WC, Lee JF, Jeng JY
Thin Solid Films, 515(20-21), 8094, 2007 |
| 8 |
Nanosecond time resolution in-situ optical reflection and transmission measurements during XeF Excimer laser interaction with amorphous silicon thin films
Kuo CC, Yeh WC, Chen CB, Jeng JY
Materials Science Forum, 505-507, 337, 2006 |
| 9 |
Tri-layer antireflection coatings (SiO2/SiO2-TiO2/TiO2) for silicon solar cells using a sol-gel technique
Lien SY, Wuu DS, Yeh WC, Liu JC
Solar Energy Materials and Solar Cells, 90(16), 2710, 2006 |
| 10 |
Monitoring explosive crystallization phenomenon of amorphous silicon thin films during short pulse duration XeF excimer laser annealing using real-time optical diagnostic measurements
Kuo CC, Yeh WC, Chen JB, Jeng JY
Thin Solid Films, 515(4), 1651, 2006 |
