검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Characterization of Basal Plane Dislocations in PVT-Grown SiC by Transmission Electron Microscopy Jeong M, Kim DY, Hong SK, Lee JY, Yeo IG, Eun TH, Chun MC Korean Journal of Materials Research, 26(11), 656, 2016 |
| No. | Article |
|---|---|
| 1 |
Characterization of Basal Plane Dislocations in PVT-Grown SiC by Transmission Electron Microscopy Jeong M, Kim DY, Hong SK, Lee JY, Yeo IG, Eun TH, Chun MC Korean Journal of Materials Research, 26(11), 656, 2016 |