검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Impact of Surface Preparation on Ni(Pt) Silicide Oxidation Huang JY, Yeo KL, Kumar A, Seet CS Electrochemical and Solid State Letters, 14(1), II42, 2011 |
| 2 |
SIMS backside depth profiling of ultra shallow implants Yeo KL, Wee ATS, See A, Liu R, Ng CM Applied Surface Science, 203, 335, 2003 |
| 3 |
Investigation of boron penetration through decoupled plasma nitrided gate oxide using backside secondary ion mass spectrometry depth profiling Yeo KL, Wee ATS, Liu R, Zhou FF, See A Journal of Vacuum Science & Technology B, 21(1), 193, 2003 |