검색결과 : 19건
| No. | Article |
|---|---|
| 1 |
Acceptor- and donor-like interfacial states at ZnSe/GaAs heterovalent interfaces Lu F, Zhu ZQ, Kimura K, Yao T Applied Surface Science, 190(1-4), 302, 2002 |
| 2 |
CdSe/ZnSSe quantum islands grown by MOVPE on homoepitaxial GaAs buffers Pohl UW, Strassburg M, Strassburg M, Krestnikov IL, Engelhardt R, Rodt S, Bimberg D Journal of Crystal Growth, 214, 717, 2000 |
| 3 |
Investigations on the growth mechanism of wide-gap II-VI semiconductors by means of reflection high energy electron diffraction Griesche J Thin Solid Films, 367(1-2), 159, 2000 |
| 4 |
ZnSe growth by radical assisted MOCVD using hollow cathode plasma Aoki T, Ikeda T, Korzec D, Hatanaka Y Thin Solid Films, 368(2), 244, 2000 |
| 5 |
In situ monitoring of ZnS/GaP and ZnSe/GaAs metalorganic vapor phase epitaxy using reflectance anisotropy spectroscopy and spectroscopic ellipsometry Meyne C, Gensch M, Peters S, Pohl UW, Zettler JT, Richter W Thin Solid Films, 364(1-2), 12, 2000 |
| 6 |
In situ reflectance difference spectroscopy of II-VI compounds: A real time study of N plasma doping during molecular beam epitaxy Stifter D, Schmid M, Hingerl K, Bonanni A, Garcia-Rocha M, Sitter H Journal of Vacuum Science & Technology B, 17(4), 1697, 1999 |
| 7 |
Native extended defects in Zn1-yGdySe/InxGa1-xAs heterostructures Muller B, Heun S, Lantier R, Rubini S, Paggel JJ, Sorba L, Bonanni A, Lazzarino M, Bonanni B, Franciosi A, Napolitani E, Romanato F, Drigo A, Bonard JM, Ganiere JD, Lazzarini L, Salviati G Journal of Vacuum Science & Technology B, 16(4), 2334, 1998 |
| 8 |
In situ determination of in-plane strain anisotropy in ZnSe(001)/GaAs layers using reflectance difference spectroscopy Hingerl K, Yasuda T, Hanada T, Miwa S, Kimura K, Ohtake A, Yao T Journal of Vacuum Science & Technology B, 16(4), 2342, 1998 |
| 9 |
Interpretation of reflectance anisotropy spectroscopy spectra of ZnSe(001) grown on GaAs(001) in terms of bulk, interface, and surface contributions Frisch AM, Schultz C, Herrmann T, Emiliani V, Wolfframm D, Evans DA, Korn M, Rossow U, Esser N, Richter W Journal of Vacuum Science & Technology B, 16(4), 2350, 1998 |
| 10 |
Analysis of ellipsometric and photoemission spectra of diluted magnetic semiconductors by hybridization interaction mechanism Kim YD, Chang YC, Klein MV Thin Solid Films, 313-314, 183, 1998 |