검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Two dimensional dopant and carrier profiles obtained by scanning capacitance microscopy on an actively biased cross-sectioned metal-oxide-semiconductor field-effect transistor Zavyalov VV, McMurray JS, Stirling SD, Williams CC, Smith H Journal of Vacuum Science & Technology B, 18(1), 549, 2000 |
| 2 |
Noise in scanning capacitance microscopy measurements Zavyalov VV, McMurray JS, Williams CC Journal of Vacuum Science & Technology B, 18(3), 1125, 2000 |