검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
In situ X-ray photoelectron spectroscopy characterization of Al2O3/InSb interface evolution from atomic layer deposition Zhernokletov DM, Dong H, Brennan B, Kim J, Wallace RM Applied Surface Science, 258(14), 5522, 2012 |
| 2 |
In situ X-ray photoelectron spectroscopy characterization of Al2O3/GaSb interface evolution McDonnell S, Zhernokletov DM, Kirk AP, Kim J, Wallace RM Applied Surface Science, 257(20), 8747, 2011 |