화학공학소재연구정보센터
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No. Article
1 Optical and structural characterization of gold island films on glass substrates
Loncaric M, Sancho-Parramon J, Zorc H, Segota S, Dubcek P, Bernstorff S
Thin Solid Films, 591, 204, 2015
2 Optical properties of gold island films-a spectroscopic ellipsometry study
Loncaric M, Sancho-Parramon J, Zorc H
Thin Solid Films, 519(9), 2946, 2011
3 Ellipsometric study of thermally induced redistribution and crystallization of Ge in Ge:SiO2 mixture layers
Janicki V, Sancho-Parramon J, Zorc H, Salamon K, Buljan M, Radic N, Desnica U
Thin Solid Films, 519(16), 5419, 2011
4 Refractive index profile modelling of dielectric inhomogeneous coatings using effective medium theories
Janicki V, Sancho-Parramon J, Zorc H
Thin Solid Films, 516(10), 3368, 2008
5 Compositional dependence of absorption coefficient and band-gap for Nb2O5-SiO2 mixture thin films
Sancho-Parramon J, Janicki V, Zorc H
Thin Solid Films, 516(16), 5478, 2008
6 Structural analysis of annealed amorphous SiO/SiO2 superlattice
Pivac B, Dubcek P, Capan I, Zorc H, Bemstorff S, Duguay S, Slaoui A
Thin Solid Films, 516(20), 6796, 2008
7 Formation of Ge, islands from a Ge layer on Si substrate during post-growth annealing
Kovacevic I, Pivac B, Dubcek P, Zorc H, Radic N, Bernstorff S, Campione M, Sassella A
Applied Surface Science, 253(6), 3034, 2007
8 Medium range ordering of amorphous silicon-carbon alloys studied by GISAXS, optical spectroscopy and IBA
Gracin D, Dubcek P, Zorc H, Juraic K
Thin Solid Films, 459(1-2), 216, 2004
9 Irradiation effects on polycrystalline silicon
Borjanovic V, Kovacevic I, Zorc H, Pivac B
Solar Energy Materials and Solar Cells, 72(1-4), 183, 2002
10 Refractive index profiling of CeO2 thin films using reverse engineering methods
Janicki V, Zorc H
Thin Solid Films, 413(1-2), 198, 2002