화학공학소재연구정보센터
검색결과 : 24건
No. Article
1 Multi-modal porous microstructure for high temperature fuel cell application
Wejrzanowski T, Haj Ibrahim S, Cwieka K, Loeffler M, Milewski J, Zschech E, Lee CG
Journal of Power Sources, 373, 85, 2018
2 Pollen structure visualization using high-resolution laboratory-based hard X-ray tomography
Li Q, Gluch J, Kruger P, Gall M, Neinhuis C, Zschech E
Biochemical and Biophysical Research Communications, 479(2), 272, 2016
3 Fabrication of customizable wedged multilayer Laue lenses by adding a stress layer
Niese S, Kruger P, Kubec A, Laas R, Gawlitza P, Melzer K, Braun S, Zschech E
Thin Solid Films, 571, 321, 2014
4 Spectroscopic and capacitance-voltage characterization of thin aminopropylmethoxysilane films doped with copper phthalocyanine, tris(dimethylvinylsilyloxy)-POSS and fullerene cages
Klocek J, Henkel K, Kolanek K, Zschech E, Schmeisser D
Applied Surface Science, 258(10), 4213, 2012
5 Studies of the chemical and electrical properties of fullerene and 3-aminopropyltrimethoxysilane based low-k materials
Klocek J, Henkel K, Kolanek K, Broczkowska K, Schmeisser D, Miller M, Zschech E
Thin Solid Films, 520(7), 2498, 2012
6 Microfabricated resistive high-sensitivity nanoprobe for scanning thermal microscopy
Wielgoszewski G, Sulecki P, Gotszalk T, Janus P, Szmigiel D, Grabiec P, Zschech E
Journal of Vacuum Science & Technology B, 28(6), C6N7, 2010
7 Local anodic oxidation by atomic force microscopy for nano-Raman strain measurements on silicon-germanium thin films
Kolanek K, Hermann P, Dudek PT, Gotszalk T, Chumakov D, Weisheit M, Hecker M, Zschech E
Thin Solid Films, 518(12), 3267, 2010
8 Challenges to quantitative energy-dispersive X-ray spectrometry and its application to graded embedded silicon-germanium for high-performance complementary metal oxide semiconductor devices
Hubner R, Engelmann HJ, Zschech E
Thin Solid Films, 519(1), 203, 2010
9 Post annealing effect on ultra-thin Hf-based high-k gate oxides on Si
Kim JH, Ignatova VA, Kucher P, Weisheit M, Zschech E
Current Applied Physics, 9(2), E104, 2009
10 Microstructural evolution of annealed ruthenium-nitrogen films
Damayanti M, Sritharan T, Mhaisalkar SG, Engelmann HJ, Zschech E, Vairagar AV, Chan L
Electrochemical and Solid State Letters, 10(6), P15, 2007