검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Method to Quantify Nanoscale Surface Charge in Liquid with Atomic Force Microscopy Li L, Eppell SJ, Zypman FR Langmuir, 36(15), 4123, 2020 |
| 2 |
Charge Calibration Standard for Atomic Force Microscope Tips in Liquids Li L, Steinmetz NF, Eppell SJ, Zypman FR Langmuir, 36(45), 13621, 2020 |
| 3 |
Obtaining Charge Distributions on Geometrically Generic Nanostructures Using Scanning Force Microscopy Jarmusik KE, Eppell SJ, Lacks DJ, Zypman FR Langmuir, 27(5), 1803, 2011 |
| 4 |
Analysis of scanning force microscope force-distance data beyond the Hookian approximation Zypman FR, Eppell SJ Journal of Vacuum Science & Technology B, 16(4), 2099, 1998 |
| 5 |
Electrostatic tip-surface interaction in scanning force microscopy : A convenient expression useful for arbitrary tip and sample geometries Zypman FR, Eppell SJ Journal of Vacuum Science & Technology B, 15(6), 1853, 1997 |