검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Short-period Si/Si1-xGex multiple quantum wells: real-time spectro-ellipsometric characterization during growth by synchrotron-radiation-excited chemical-beam epitaxy Akazawa H Applied Surface Science, 216(1-4), 554, 2003 |
| No. | Article |
|---|---|
| 1 |
Short-period Si/Si1-xGex multiple quantum wells: real-time spectro-ellipsometric characterization during growth by synchrotron-radiation-excited chemical-beam epitaxy Akazawa H Applied Surface Science, 216(1-4), 554, 2003 |