검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Nanostructuring of Ta2O5 surfaces by low energy Ar+ bombardment Benito N, Palacio C Applied Surface Science, 351, 753, 2015 |
| 2 |
SIMS depth profiling and TEM imaging of the SIMS altered layer Christofi A, Walker JF, McPhail DS Applied Surface Science, 255(4), 1381, 2008 |
| 3 |
Time resolved alteration process of oxide glasses Girard L, Arab M, Spalla O Journal of Colloid and Interface Science, 319(1), 214, 2008 |
| 4 |
Effect of Pb-rich and Fe-rich entities during alteration of a partially vitrified metallurgical waste Seignez N, Gauthier A, Bulteel D, Buatier A, Recourt P, Damidot D, Potdevin JL Journal of Hazardous Materials, 149(2), 418, 2007 |
| 5 |
An XPS study on ion beam induced oxidation of titanium silicide Osiceanu P Applied Surface Science, 253(1), 381, 2006 |
| 6 |
Auger electron spectroscopy investigation of sputter induced altered layers in SiC by low energy sputter depth profiling and factor analysis Kosiba R, Ecke G, Liday J, Breza J, Ambacher O Applied Surface Science, 220(1-4), 304, 2003 |