화학공학소재연구정보센터
검색결과 : 15건
No. Article
1 Impact of Forming Gas Annealing and Firing on the Al2O3/p-Si Interface State Spectrum
Simoen E, Rothschild A, Vermang B, Poortmans J, Mertens R
Electrochemical and Solid State Letters, 14(9), H362, 2011
2 Low Resistance CrB2/Ti/Al Ohmic Contacts to N-face n-GaN for High Power GaN-Based Vertical Light Emitting Diodes
Park SH, Jeon JW, Lee SY, Moon J, Song JO, Seong TY
Electrochemical and Solid State Letters, 13(10), H333, 2010
3 Effect of Solvent-Assisted Thermal Treatment on the Performance of Polyfluorene-Based Polymer Light Emitting Diodes
Chang MY, Yen HB, Hung CY, Chen YF, Lin SC, Huang WY, Han YK
Journal of the Electrochemical Society, 157(4), J116, 2010
4 Electrical Properties of Ti/Al Ohmic Contacts to Sulfur-Passivated N-Face n-Type GaN for Vertical-Structure Light-Emitting Diodes
Jung SY, Seong TY, Kim H, Park KS, Park JG, Namgoong G
Electrochemical and Solid State Letters, 12(7), H275, 2009
5 p-Type Conversion of ZnO Thin Films by Plasma Immersion Ion Implantation
Zhang SY, Liang RQ, Ou QR, Wu XJ, Jiang MF, Nie ZF, Liu F, Chang XJ, Wang YP, Du J, Wang PJ, Xin QQ
Electrochemical and Solid State Letters, 12(9), H329, 2009
6 Effects of annealing in N-2 on sputtered Al-doped ZnO thin films
Lennon C, Kodama R, Chang Y, Sivananthan S, Deshpande M
Journal of Vacuum Science & Technology B, 27(3), 1641, 2009
7 Effect of aluminum annealing on the galvanoluminescence properties of anodic oxide films formed in organic electrolytes
Sarvan M, Stojadinovic S, Kasalica B, Belca I, Zekovic L
Electrochimica Acta, 53(5), 2183, 2008
8 Structure and interdiffusion of epitaxial ZnO/ZnMgO nanolayered thin films
Stevens BL, Cohen DJ, Barnett SA
Journal of Vacuum Science & Technology A, 26(6), 1538, 2008
9 Spatial uniformity of the rate of grain coarsening in a submicron Al-Sc alloy produced by severe plastic deformation
Ferry M
Materials Science Forum, 503-504, 251, 2006
10 Particle evolution and grain growth during annealing of a complex multiphase Al-Sn triboalloy
Cerrud SM, Schouwenaars R, Ramirez EI, Ortiz A
Materials Science Forum, 467-470, 963, 2004