검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Polarized infrared reflectance studies for wurtzite InN epilayers on Si(111) grown by molecular beam expitaxy Ooi PK, Lee SC, Ng SS, Hassan Z, Abu Hassan H, Chen WL Thin Solid Films, 520(2), 739, 2011 |
| 2 |
Investigation of variable incidence angle spectroscopic ellipsometry for determination of below band gap uniaxial dielectric function Kildemo M, Hunderi O Materials Science Forum, 353-356, 417, 2001 |