검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
SIMS analysis of HfSiO(N) thin films Miwa S, Kusanagi S, Kobayashi H Applied Surface Science, 252(19), 7176, 2006 |
| 2 |
Accurate depth profiling for ultra-shallow implants using backside-SIMS Hongo C, Tomita M, Takenaka M Applied Surface Science, 231-2, 673, 2004 |
| 3 |
Copper-indium-gallium-diselenide/molybdenum layers analyzed by corrected SIMS depth profiles Bilger G, Grabitz PO, Strohm A Applied Surface Science, 231-2, 804, 2004 |
| 4 |
Accurate SIMS depth profiling for ultra-shallow implants using backside SIMS Hongo C, Tomita A, Takenaka M, Murakoshi A Applied Surface Science, 203, 264, 2003 |
| 5 |
SIMS backside depth profiling of ultra shallow implants Yeo KL, Wee ATS, See A, Liu R, Ng CM Applied Surface Science, 203, 335, 2003 |