| 1 |
Transient growth and thinning of the barrier oxide layer on iron measured by real-time spectroscopic ellipsometry
Lu ZJ, Macdonald DD
Electrochimica Acta, 53(26), 7696, 2008 |
| 2 |
Dissolution behaviour of the barrier layer of porous oxide films on aluminum formed in phosphoric acid studied by a re-anodizing technique
Vrublevsky I, Parkoun V, Schreckenbach J, Goedel WA
Applied Surface Science, 252(14), 5100, 2006 |
| 3 |
Analysis of chemical dissolution of the barrier layer of porous oxide on aluminum thin films using a re-anodizing technique
Vrublevsky I, Parkoun V, Sokol V, Schreckenbach J
Applied Surface Science, 252(1), 227, 2005 |
| 4 |
Study of chemical dissolution of the barrier oxide layer of porous alumina films formed in oxalic acid using a re-anodizing technique
Vrublevsky I, Parkoun V, Sokol V, Schreckenbach J
Applied Surface Science, 236(1-4), 270, 2004 |
| 5 |
Dynamics and temperature dependence of etching processes of porous and barrier aluminum oxide layers
Brevnov DA, Rao GVR, Lopez GP, Atanassov PB
Electrochimica Acta, 49(15), 2487, 2004 |
