검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Chemical self-organization length scales in non- and nano-crystalline thin films Lucovsky G, Phillips JC Solid-State Electronics, 51(10), 1308, 2007 |
| 2 |
Defects and defect relaxation at internal interfaces between high-k transition metal and rare earth dielectrics and interfacial native oxides in metal oxide semiconductor (MOS) structures Lucovsky G, Phillips JC Thin Solid Films, 486(1-2), 200, 2005 |