| 1 |
Investigating degradation behaviors induced by hot carriers in the etch stop layer in amorphous InGaZnO thin film transistors with different electrode materials and structures
Yang CI, Chang TC, Chen BW, Chou WC, Liao PY, Lin SC, Yeh CY, Chang CS, Tsai CM, Yu MC
Thin Solid Films, 644, 45, 2017 |
| 2 |
Hot carrier degradation mechanism interpretation by lateral distribution of interface and bulk trap density
Chae H, Shin S, Choi J, Seo S
Current Applied Physics, 15(11), 1412, 2015 |
| 3 |
Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETs
Liu KJ, Chang TC, Yang RY, Chen CE, Ho SH, Tsai JY, Hsieh TY, Cheng O, Huang CT
Thin Solid Films, 572, 39, 2014 |
| 4 |
Promoting effect of ZrO2 carrier on activity and thermal stability of CeO2-based oxides catalysts for toluene combustion
Lu HF, Zhou Y, Han WF, Huang HF, Chen YF
Applied Catalysis A: General, 464, 101, 2013 |
| 5 |
Impact of velocity saturation and hot carrier effects on channel thermal noise model of deep sub-micron MOSFETs
Ong SN, Yeo KS, Chew KWJ, Chan LHK, Loo XS, Boon CC, Do MA
Solid-State Electronics, 72, 8, 2012 |
| 6 |
Degradation of 1/f noise in short channel MOSFETs due to halo angle induced V-T non-uniformity and extra trap states at interface
Ahsan AKM, Ahmed S
Solid-State Electronics, 50(11-12), 1705, 2006 |
| 7 |
Effect of carrier type on coupled transport kinetics of thiocyanate ions through liquid membranes
Kobya M, Demirbas E, Demircioglu N, Yildirim Y, Yildiz YS
Desalination, 160(3), 253, 2004 |
| 8 |
Modeling of electron gate current and post-stress drain current of p-type silicon-on-insulator MOSFETs
Sheu CJ, Jang SL
Solid-State Electronics, 47(4), 705, 2003 |
| 9 |
The influence of geometric structure on the hot-carrier-effect immunity for deep-sub-micron grooved gate PMOSFET
Ren HX, Hao Y
Solid-State Electronics, 46(5), 665, 2002 |
| 10 |
Limiting carrier effect in a-Si : H solar cells
Prentice JSC
Solar Energy Materials and Solar Cells, 69(1), 9, 2001 |
