검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Characterization by ion beams of surfaces and interfaces of alternative materials for future microelectronic devices Krug C, Stedile FC, Radtke C, da Rosa EBO, Morais J, Freire FL, Baumvol IJR Applied Surface Science, 212, 556, 2003 |