검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Depth profile characterization of low-energy B+- and Ge+-ion-implanted Si Karmakov I, Chakarov I, Konova A Applied Surface Science, 211(1-4), 270, 2003 |
| No. | Article |
|---|---|
| 1 |
Depth profile characterization of low-energy B+- and Ge+-ion-implanted Si Karmakov I, Chakarov I, Konova A Applied Surface Science, 211(1-4), 270, 2003 |