검색결과 : 285건
| No. | Article |
|---|---|
| 1 |
Depth profiling and photometric characteristics of Pr3+ doped BaMoO4 thin phosphor films grown using (266 nm Nd-YAG laser) pulsed laser deposition Krishnan R, Swart HC, Thirumalai J, Kumar P Applied Surface Science, 488, 783, 2019 |
| 2 |
ToF-SIMS depth profiling of nanoparticles: Chemical structure of core-shell quantum dots Gulin A, Shakhov A, Vasin A, Astafiev A, Antonova O, Kochev S, Kabachii Y, Golub A, Nadtochenko V Applied Surface Science, 481, 144, 2019 |
| 3 |
Prediction and experimental determination of the layer thickness in SIMS depth profiling of Ge/Si multilayers: Effect of preferential sputtering and atomic mixing Lian SY, Kim KJ, Kim TG, Hofmann S, Wang JY Applied Surface Science, 481, 1103, 2019 |
| 4 |
Ex-situ SIMS characterization of plasma-deposited polystyrene near atmospheric pressure Cristaudo V, Merche D, Poleunis C, Devaux J, Eloy P, Reniers F, Delcorte A Applied Surface Science, 481, 1490, 2019 |
| 5 |
Experimental methods in chemical engineering: X-ray photoelectron spectroscopy-XPS Lefebvre J, Galli F, Bianchi CL, Patience GS, Boffito DC Canadian Journal of Chemical Engineering, 97(10), 2588, 2019 |
| 6 |
Chemical interaction of D9 alloy clad with B4C in liquid sodium: Studies employing XPS, XRD, and SEM Chandran K, Clinsha PC, Lavanya M, Anthonysamy S, Gnanasekar KI Journal of the American Ceramic Society, 102(5), 2932, 2019 |
| 7 |
Damage accumulation and implanted Gd and Au position in a- and c-plane GaN Mackova A, Malinsky P, Jagerova A, Miksova R, Sofer Z, Klimova K, Mikulics M, Bottger R, Akhmadaliev S, Oswald J Thin Solid Films, 680, 102, 2019 |
| 8 |
Investigation of anodic TiO2 nanotube composition with high spatial resolution AES and ToF SIMS Dronov A, Gavrilin I, Kirilenko E, Dronova D, Gavrilov S Applied Surface Science, 434, 148, 2018 |
| 9 |
Quantitative analysis of Si1-xGex alloy films by SIMS and XPS depth profiling using a reference material Oh WJ, Jang JS, Lee YS, Kim A, Kim KJ Applied Surface Science, 432, 72, 2018 |
| 10 |
XPS study of multilayer multicomponent films Lubenchenko AV, Batrakov AA, Pavolotsky AB, Lubenchenko OI, Ivanov DA Applied Surface Science, 427, 711, 2018 |