검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Deconvolution of very low primary energy SIMS depth profiles2w Fares B, Gautier B, Dupuy JC, Prudon G, Holliger P Applied Surface Science, 252(19), 6478, 2006 |
| 2 |
mu c-Si : H n-type doped layers resistant against HWCVD i-layers deposited at high temperature and high growth rate Gordijn A, Francke J, Rath JK, Schropp REI Thin Solid Films, 501(1-2), 338, 2006 |
| 3 |
Investigation of interface charges at the heterojunction discontinuity in HBT devices de la Fuente JG, Krozer V Solid-State Electronics, 46(9), 1273, 2002 |
| 4 |
Diagnostics of Si multi-delta-doped GaAs layers by Raman spectroscopy on bevelled structures Srnanek R, Gurnik P, Harmatha L, Gregora I Applied Surface Science, 183(1-2), 86, 2001 |
| 5 |
Laser doping in Si, InP and GaAs Pokhmurska A, Bonchik O, Kiyak S, Savitski G, Gloskovsky A Applied Surface Science, 154, 712, 2000 |