검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Bias-stress induced threshold voltage and drain current instability in 4H-SiC DMOSFETs Okayama T, Arthur SD, Garrett JL, Rao MV Solid-State Electronics, 52(1), 164, 2008 |
| No. | Article |
|---|---|
| 1 |
Bias-stress induced threshold voltage and drain current instability in 4H-SiC DMOSFETs Okayama T, Arthur SD, Garrett JL, Rao MV Solid-State Electronics, 52(1), 164, 2008 |