| 1 |
Following Chemical Charge Trapping in Pentacene Thin Films by Selective Impurity Doping and Wavelength-Resolved Electric Force Microscopy
Smieska LM, Pozdin VA, Luria JL, Hennig RG, Hines MA, Lewis CA, Marohn JA
Advanced Functional Materials, 22(24), 5096, 2012 |
| 2 |
Deflection and pull-in instability of nanoscale beams in liquid electrolytes
Boyd JG, Lee J
Journal of Colloid and Interface Science, 356(2), 387, 2011 |
| 3 |
Comparison of three methods for the evaluation of the electric force on a particle in electrophoresis
Hsu JP, Yeh LH
Journal of the Chinese Institute of Chemical Engineers, 37(6), 601, 2006 |
| 4 |
Microstructure of Ag2S-As2S3 glasses
Piarristeguy A, Ramonda M, Kuwata N, Pradel A, Ribes M
Solid State Ionics, 177(35-36), 3157, 2006 |
| 5 |
Electric force microscopy of dielectric heterogeneous polymer blends
Krayev AV, Talroze RV
Polymer, 45(24), 8195, 2004 |
| 6 |
Modeling of electrostatic spray in a venturi scrubber
Yang HT, Viswanathan S, Balachandran W, Ray MB
Journal of Chemical Technology and Biotechnology, 78(2-3), 181, 2003 |
| 7 |
Characterisation of the topography and surface potential of electrodeposited conducting polymer films using atomic force and electric force microscopies
Barisci JN, Stella R, Spinks GM, Wallace GG
Electrochimica Acta, 46(4), 519, 2000 |
| 8 |
Electric force microscopy study of the surface electrostatic property of rubbed polyimide alignment layers
Liang X, Liu J, Han L, Tang H, Xu SY
Thin Solid Films, 370(1-2), 238, 2000 |
