검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Degradation and recovery of SiGeHBTs following radiation and hot-carrier stressing Sheng SR, McAlister SP, McCaffrey JP, Kovacic SJ Solid-State Electronics, 48(10-11), 1901, 2004 |
| No. | Article |
|---|---|
| 1 |
Degradation and recovery of SiGeHBTs following radiation and hot-carrier stressing Sheng SR, McAlister SP, McCaffrey JP, Kovacic SJ Solid-State Electronics, 48(10-11), 1901, 2004 |