| 1 |
Relationship between absorber layer defect density and performance of a-Si:H and mu c-Si:H solar cells studied over a wide range of defect densities generated by 2 MeV electron bombardment
Astakhov O, Smirnov V, Carius R, Pieters BE, Petrusenko Y, Borysenko V, Finger F
Solar Energy Materials and Solar Cells, 129, 17, 2014 |
| 2 |
Mechanisms of hardening, wear and corrosion improvement of 316 L stainless steel by low energy high current pulsed electron beam surface treatment
Zou JX, Zhang KM, Hao SZ, Dong C, Grosdidier T
Thin Solid Films, 519(4), 1404, 2010 |
| 3 |
SIMS direct surface imaging of Cu1-xCrx formation
Lamperti A, Ossi PM
Applied Surface Science, 252(6), 2288, 2006 |
| 4 |
Titanium oxidation-reduction at low oxygen pressure under electron bombardment
Brasca R, Passeggi MCG, Ferron J
Thin Solid Films, 515(4), 2021, 2006 |
| 5 |
Development of the novel electron bombardment anneal system (EBAS) for SiC post ion implantation anneal
Shibagaki M, Kurematsu Y, Watanabe F, Haga S, Miura K, Suzuki T, Satoh M
Materials Science Forum, 483, 609, 2005 |
| 6 |
The effect of electron bombardment on optical properties of n-type silicon
Sari AH, Osman F, Ghoranneviss M, Hora H, Hopfl R, Hantehzadeh MR
Applied Surface Science, 237(1-4), 161, 2004 |
| 7 |
The influence of primary ion bombardment conditions on the secondary ion emission behavior of polymer additives
Kersting R, Hagenhoff B, Pijpers P, Verlaek R
Applied Surface Science, 203, 561, 2003 |
| 8 |
A study of noise and collateral phenomena observed in central-cathode magnetron devices
Karzhavin IA, Neyman BZ, Gundobin GS, Vislov VI, Lashenko AV, Levande AB
Applied Surface Science, 215(1-4), 291, 2003 |
| 9 |
Molecular No Desorption from Crystalline-Sodium Nitrate by Resonant Excitation of the NO3- Pi-Pi-Asterisk Transition
Bradley RA, Lanzendorf E, Mccarthy MI, Orlando TM, Hess WP
Journal of Physical Chemistry, 99(30), 11715, 1995 |
| 10 |
Ionization Induced Fragmentation of Size-Selected Neutral Sodium Clusters
Bewig L, Buck U, Mehlmann C, Winter M
Journal of Chemical Physics, 100(4), 2765, 1994 |
