검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
KPFM imaging of Si(111)5 root 3 x 5 root 3-Sb surface for atom distinction using NC-AFM Okamoto K, Yoshimoto K, Sugawara Y, Morita S Applied Surface Science, 210(1-2), 128, 2003 |
| 2 |
The elimination of the'artifact' in the electrostatic force measurement using a novel noncontact atomic force micro scope/electrostatic force microscope Okamoto K, Sugawara Y, Morita S Applied Surface Science, 188(3-4), 381, 2002 |