검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Ellipsometric characterisation of heterogeneous 2D layers Wormeester H, Kooij ES, Mewe A, Rekveld S, Poelsema B Thin Solid Films, 455-56, 323, 2004 |
| No. | Article |
|---|---|
| 1 |
Ellipsometric characterisation of heterogeneous 2D layers Wormeester H, Kooij ES, Mewe A, Rekveld S, Poelsema B Thin Solid Films, 455-56, 323, 2004 |