화학공학소재연구정보센터
검색결과 : 17건
No. Article
1 Relationship of the shape and size between etch pits and corresponding Te inclusions in CdZnTe crystals
Zhang JJ, Zhu LH, Sun SW, Yu HX, Xu C, Yang JR
Journal of Crystal Growth, 512, 90, 2019
2 Investigation of anodic oxidation mechanism of 4H-SiC (0001) for electrochemical mechanical polishing
Yang X, Sun RY, Ohkubo Y, Kawai K, Arima K, Endo K, Yamamura K
Electrochimica Acta, 271, 666, 2018
3 Temperature dependence of indentation size effect, dislocation pile-ups, and lattice friction in (001) strontium titanate
Javaid F, Johanns KE, Patterson EA, Durst K
Journal of the American Ceramic Society, 101(1), 356, 2018
4 3D Dislocation structure evolution in strontium titanate: Spherical indentation experiments and MD simulations
Javaid F, Stukowski A, Durst K
Journal of the American Ceramic Society, 100(3), 1134, 2017
5 MBE growth of PbSe thin film with a 9 x 10(5) cm(-2) etch-pits density on patterned (111)-oriented Si substrate
Zhao F, Ma J, Weng B, Li D, Bi G, Chen A, Xu J, Shi Z
Journal of Crystal Growth, 312(19), 2695, 2010
6 Removal of Si(111) wafer surface etch pits generated in ammonia-peroxide clean step
Xiao ZW, Xu MX, Ohgi T, Onishi K, Fujita D
Applied Surface Science, 221(1-4), 160, 2004
7 Step free surface heteroepitaxy of 3C-SiC layers on patterned 4H/6H-SiC mesas and cantilevers
Neudeck PG, Powell JA, Trunek AJ, Spry DJ
Materials Science Forum, 457-460, 169, 2004
8 Two-step epitaxial lateral overgrowth of GaN
Ko CH, Su YK, Chang SJ, Tsai TY, Kuan TM, Lan WH, Lin JC, Lin WJ, Cherng YT, Webb JB
Materials Chemistry and Physics, 82(1), 55, 2003
9 Growth 3nd evaluation of high quality SiC crystal by sublimation method
Oyanagi N, Yamaguchi H, Kato T, Nishizawa S, Arai K
Materials Science Forum, 389-3, 87, 2002
10 A simple mapping method for elementary screw dislocations in homoepitaxial SiC layers
Ha S, Vetter WM, Dudley M, Skowronski M
Materials Science Forum, 389-3, 443, 2002