1 |
Effect of a Multi-Step Gap-Filling Process to Improve Adhesion between Low-K Films and Metal Patterns Lee W, Kim TH, Choa YH Korean Journal of Materials Research, 26(8), 427, 2016 |
2 |
Gap-Fill Characteristics and Film Properties of DMDMOS Fabricated by an F-CVD System Lee W, Fukazawa A, Choa YH Korean Journal of Materials Research, 26(9), 455, 2016 |
3 |
Gap Fill Morphology Control in Liquid-phase Crystal Growth by Use of a Magnetic Field Kato H, Ushikubo S, Yokota M, Doki N, Ogawa K, Shimizu K KAGAKU KOGAKU RONBUNSHU, 37(4), 356, 2011 |
4 |
Integration of a stack of two fluorine doped silicon oxide film with ULSI interconnect metallization Cheng YL, Wang YL, Liu CP, Wu YL, Lo KY, Liu CW, Lan JK, Ay C, Feng MS Materials Chemistry and Physics, 83(1), 150, 2004 |
5 |
Characterization and reliability of low dielectric constant fluorosilicate glass and silicon rich oxide process for deep sub-micron device application Cheng YL, Wang YL, Liu CW, Wu YL, Lo KY, Liu CP, Lan JK Thin Solid Films, 398-399, 533, 2001 |