검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Hot-electron reliability improvement using perhydropolysilazane spin-on-dielectric passivation buffer layers for AlGaN/GaN HEMTs Iqbal M, Ko PS, Kim SD Current Applied Physics, 14(8), 1099, 2014 |
| 2 |
Reliability properties of SiGeHBTs Rennane A, Bary L, Roux JL, Kuchenbecker J, Graffeuil J, Plana R Applied Surface Science, 224(1-4), 341, 2004 |