| 1 |
Sulfur-hyperdoped silicon nanocrystalline layer prepared on polycrystalline silicon solar cell substrate by thin film deposition and nanosecond-pulsed laser irradiation
Wen C, Yang YJ, Ma YJ, Shi ZQ, Wang ZJ, Mo J, Li TC, Li XH, Hu SF, Yang WB
Applied Surface Science, 476, 49, 2019 |
| 2 |
Two-dimensional thermoluminescence method for checking LiF crystals homogeneity
Marczewska B, Bilski P, Gieszczyk W, Klosowski M
Journal of Crystal Growth, 457, 320, 2017 |
| 3 |
Mineralogical Analysis and Mechano-Chemical Purification of Natural Silica Ore for High Purity Silica Powder
Park J, Lee CK, Lee HK
Korean Journal of Materials Research, 26(6), 306, 2016 |
| 4 |
Gallium Implantation and Diffusion in Crystalline Germanium
Ioannou N, Skarlatos D, Vouroutzis NZ, Georga SN, Krontiras CA, Tsamis C
Electrochemical and Solid State Letters, 13(3), H70, 2010 |
| 5 |
Interaction of NiSi with dopants for metallic source/drain applications
Luo J, Qiu ZJ, Zhang Z, Ostling M, Zhang SL
Journal of Vacuum Science & Technology B, 28(1), C1I1, 2010 |
| 6 |
Grazing incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for the characterization of ultrashallow arsenic distribution in silicon
Pepponi G, Giubertoni D, Bersani M, Meirer F, Ingerle D, Steinhauser G, Streli C, Hoenicke P, Beckhoff B
Journal of Vacuum Science & Technology B, 28(1), C1C59, 2010 |
| 7 |
Distribution of impurity elements in slag-silicon equilibria for oxidative refining of metallurgical silicon for solar cell applications
Johnston MD, Barati M
Solar Energy Materials and Solar Cells, 94(12), 2085, 2010 |
| 8 |
Metal-Oxide Scale Interfacial Imperfections and Performance of Stainless Steels Utilized as Interconnects in Solid Oxide Fuel Cells
Shaigan N, Ivey DG, Chen WX
Journal of the Electrochemical Society, 156(6), B765, 2009 |
| 9 |
Energy Transfer Between Activators at Different Crystallographic Sites
Ahn D, Shin N, Park KD, Sohn KS
Journal of the Electrochemical Society, 156(9), J242, 2009 |
| 10 |
ToF-SIMS imaging of Cl at Cu grain boundaries in interconnects for microelectronics
Barnes JP, Carreau V, Maitrejean S
Applied Surface Science, 255(4), 1564, 2008 |
