검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Interface characterization and current conduction in HfO2-gated MOS capacitors Chen HW, Chiu FC, Liu CH, Chen SY, Huang HS, Juan PC, Hwang L Applied Surface Science, 254(19), 6112, 2008 |
| No. | Article |
|---|---|
| 1 |
Interface characterization and current conduction in HfO2-gated MOS capacitors Chen HW, Chiu FC, Liu CH, Chen SY, Huang HS, Juan PC, Hwang L Applied Surface Science, 254(19), 6112, 2008 |