검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
An analytical expression for predicting wearout lifetime of thin gate and tunneling oxide Xu MZ, Tan CH Solid-State Electronics, 46(1), 115, 2002 |
| 2 |
The Reliability Evaluation of Thin Silicon Dioxide Using the Stepped Current Tddb Technique Yoneda K, Okuma K, Hagiwara K, Todokoro Y Journal of the Electrochemical Society, 142(2), 596, 1995 |