검색결과 : 29건
No. | Article |
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1 |
Characteristics of Slice InGaN/GaN Light Emitting Diodes by Focused Ion Beam Milling Hsu CK, Sheu JK, Wang JK, Lee ML, Chang KH, Tu SJ, Lai WC Electrochemical and Solid State Letters, 14(8), H343, 2011 |
2 |
Vertically Aligned Liquid Crystals on Tantalum Oxide Thin Films Using Ion Beam Irradiation Processing Lee JW, Lim JH, Oh BY, Kim YH, Park HG, Kim BY, Hwang JY, Ok CH, Moon BM, Seo DS Journal of the Electrochemical Society, 157(4), J107, 2010 |
3 |
Effects of He Plasma Pretreatment on Low-k Damage during Cu Surface Cleaning with NH3 Plasma Urbanowicz AM, Shamiryan D, Zaka A, Verdonck P, De Gendt S, Baklanov MR Journal of the Electrochemical Society, 157(5), H565, 2010 |
4 |
Indium oxide thin film transistors fabricated by low-energetic ion bombardment technique at room temperature Chu AK, Hong TI, Tien WC Journal of Vacuum Science & Technology B, 28(1), 211, 2010 |
5 |
Characterization of focused-ion-beam induced defect structures in graphite for the future guided self-assembly of molecules (vol 27, pg 2209, 2009) O'Donnell SE, Buttner M, Reinke P Journal of Vacuum Science & Technology B, 28(1), 216, 2010 |
6 |
Enhancement of ion-induced bending phenomenon using a double-layered film for field emitter array fabrication Yoshida T, Nagao M, Kanemaru S Journal of Vacuum Science & Technology B, 28(2), C2C1, 2010 |
7 |
Direct growth of carbon nanofibers on metal mesh substrates by ion irradiation method Zamri M, Ghosh P, Wang ZP, Kawagishi M, Hayashi A, Hayashi Y, Tanemura M Journal of Vacuum Science & Technology B, 28(2), C2C9, 2010 |
8 |
High-current, low-cost field emission triode using a reticulated vitreous carbon cathode Carpenter AC, Hunt CE Journal of Vacuum Science & Technology B, 28(2), C2C37, 2010 |
9 |
Nanosmoothing of single crystal diamond chips by 1 keV Ar+ ion bombardment Nagase T, Kato H, Pahlovy SA, Miyamoto I Journal of Vacuum Science & Technology B, 28(2), 263, 2010 |
10 |
Effects of focused MeV ion beam irradiation on the roughness of electrochemically micromachined silicon surfaces Ow YS, Azimi S, Breese MBH, Teo EJ, Mangaiyarkarasi D Journal of Vacuum Science & Technology B, 28(3), 500, 2010 |