검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Scanning-helium-ion-beam lithography with hydrogen silsesquioxane resist Winston D, Cord BM, Ming B, Bell DC, DiNatale WF, Stern LA, Vladar AE, Postek MT, Mondol MK, Yang JKW, Berggren KK Journal of Vacuum Science & Technology B, 27(6), 2702, 2009 |
| 2 |
On the influence of the sputtering in determining the resolution of a scanning ion microscope Castaldo V, Hagen CW, Kruit P, van Veldhoven E, Maas D Journal of Vacuum Science & Technology B, 27(6), 3196, 2009 |
| 3 |
Toroidal spectrometer for signal detection in scanning ion/electron microscopes Hoang HQ, Khursheed A Journal of Vacuum Science & Technology B, 27(6), 3226, 2009 |
| 4 |
Understanding imaging modes in the helium ion microscope Scipioni L, Sanford CA, Notte J, Thompson B, McVey S Journal of Vacuum Science & Technology B, 27(6), 3250, 2009 |