검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Investigation of deep level defects in copper irradiated bipolar junction transistor Madhu KV, Kumar R, Ravindra M, Damle R Solid-State Electronics, 52(8), 1237, 2008 |
| 2 |
Damage evolution and recovery in Al-implanted 4H-SiC Zhang Y, Weber WJ, Jiang W, Hallen A, Possnert G Materials Science Forum, 389-3, 815, 2002 |
| 3 |
Characterization of radiation-induced defects in ZnO probed by positron annihilation spectroscopy Brunner S, Puff W, Balogh AG, Mascher P Materials Science Forum, 363-3, 141, 2001 |