검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Local lattice strain measurements in semiconductor devices by using convergent-beam electron diffraction Toda A, Ikarashi N, Ono H Journal of Crystal Growth, 210(1-3), 341, 2000 |
| No. | Article |
|---|---|
| 1 |
Local lattice strain measurements in semiconductor devices by using convergent-beam electron diffraction Toda A, Ikarashi N, Ono H Journal of Crystal Growth, 210(1-3), 341, 2000 |