| 1 |
SIMS artifacts in the near surface depth profiling of oxygen conducting ceramics
Fearn S, Rossiny J, Kilner J
Solid State Ionics, 179(21-26), 811, 2008 |
| 2 |
Sodium and hydrogen analysis of room temperature glass corrosion using low energy CsSIMS
Fearn S, McPhail DS, Morris RJH, Dowsett MG
Applied Surface Science, 252(19), 7070, 2006 |
| 3 |
uleSIMS characterization of silver reference surfaces
Palitsin VV, Dowsett MG, de la Mata BG, Oloff IW, Gibbons R
Applied Surface Science, 252(19), 7132, 2006 |
| 4 |
Different optical conductivity enhancement (OCE) protocols to eliminate charging during ultra low energy SIMS profiling of semiconductor and semi-insulating materials
Morris RJH, Dowsett MG, Chang RJH
Applied Surface Science, 252(19), 7221, 2006 |
| 5 |
Room temperature corrosion of museum glass: an investigation using low-energy SIMS
Fearn S, McPhail DS, Oakley V
Applied Surface Science, 231-2, 510, 2004 |
| 6 |
Depth profiling using ultra-low-energy secondary ion mass spectrometry
Dowsett MG
Applied Surface Science, 203, 5, 2003 |
| 7 |
The energy spectra of secondary ions sputtered from Si and SiGe by ultra-low-energy primary ions
Bellingham J, Dowsett MG
Applied Surface Science, 203, 130, 2003 |
| 8 |
B4C/Mo/Si and Ta2O5/Ta nanostructures analysed by ultra-low energy argon ion beams
Konarski P, Mierzejewska A
Applied Surface Science, 203, 354, 2003 |
| 9 |
Determination of the variation in sputter yield in the SIMS transient region using MEIS
Dowsett MG, Ormsby TJ, Gard FS, Al-Harthi SH, Guzman B, McConville CF, Noakes TCQ, Bailey P
Applied Surface Science, 203, 363, 2003 |
| 10 |
Quantitative depth profiling of nitrogen in ultrathin oxynitride film with low energy SIMS
Shon HK, Kang HJ, Hong TE, Chang HS, Kim KJ, Kim HK, Moon DW
Applied Surface Science, 203, 423, 2003 |
