검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Backside and frontside depth profiling of B delta doping, at low energy, using new and previous magnetic SIMS instruments Laugier F, Hartmann JM, Moriceau H, Holliger P, Truche R, Dupuy JC Applied Surface Science, 231-2, 668, 2004 |
| 2 |
Comparison between Xe+ and O-2(+) primary ions, at low impact energy, on B delta-doping, SiGe-Si superlattice and Al/Ti multilayer structures Laugier F, Holliger P, Dupuy JC, Baboux N Applied Surface Science, 203, 348, 2003 |