검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Atomic resolution imaging and force versus distance measurements on KBr (001) using low temperature scanning force microscopy Hoffmann R, Lantz MA, Hug HJ, van Schendel PJA, Kappenberger P, Martin S, Baratoff A, Guntherodt HJ Applied Surface Science, 188(3-4), 238, 2002 |