화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 Improved DC and RF performance of InAlAs/InGaAs InP based HEMTs using ultra-thin 15 nm ALD-Al(2)O3 surface passivation
Asif M, Chen C, Peng D, Xi W, Zhi J
Solid-State Electronics, 142, 36, 2018
2 ALD Al2O3 passivation of L-g=100 nm metamorphic InAlAs/InGaAs HEMTs with Si-doped Schottky layers on GaAs substrates
Sun B, Chang HD, Wang SK, Niu JB, Liu HG
Solid-State Electronics, 138, 40, 2017
3 Ultra-thin 20 nm-PECVD-Si3N4 surface passivation in T-shaped gate InAlAs/InGaAs InP-based HEMTs and its impact on DC and RF performance
Ding P, Chen C, Ding WC, Yang F, Su YB, Wang DH, Jin Z
Solid-State Electronics, 123, 1, 2016
4 RF characteristic of MESFET on H-terminated DC arc jet CVD diamond film
Liu JL, Li CM, Zhu RH, Guo JC, Chen LX, Wei JJ, Hei LF, Wang JJ, Feng ZH, Guo H, Lv FX
Applied Surface Science, 284, 798, 2013
5 Fabrication of enhancement-mode AlGaN/GaN high electron mobility transistors using double plasma treatment
Lim JW, Ahn HK, Kim SI, Kang DM, Lee JM, Min BG, Lee SH, Yoon HS, Ju CW, Kim H, Mun JK, Nam ES, Park HM
Thin Solid Films, 547, 106, 2013
6 Half-terahertz silicon/germanium heterojunction bipolar technologies: A TCAD based device architecture exploration
Sibaja-Hernandez A, You SZ, Van Huylenbroeck S, Venegas R, De Meyer K, Decoutere S
Solid-State Electronics, 65-66, 72, 2011
7 Optimization of external poly base sheet resistance in 0.13 mu m quasi self-aligned SiGe:C HBTs
You S, Van Huylenbroeck S, Nguyen ND, Sibaja-Hernandez A, Venegas R, Van Wichelen K, Decoutere S, De Meyer K
Thin Solid Films, 518, S68, 2010
8 High frequency performance of sub-100 nm UTB-FDSOI featuring TiN/HfO2 gate stack
Lim TC, Rozeau O, Buj C, Paccaud M, Lepilliet S, Dambrine G, Danneville F
Solid-State Electronics, 53(4), 433, 2009
9 The impact of the intrinsic and extrinsic resistances of double gate SOI on RF performance
Lim TC, Armstrong GA
Solid-State Electronics, 50(5), 774, 2006
10 Effect of surface treatment on electrical properties of AlGaAs/GaAs heterojunction bipolar transistor
Baek CH, Oh TK, Kang BK
Solid-State Electronics, 49(8), 1335, 2005