검색결과 : 1건
No. | Article |
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1 |
Charge trapping memory structures with Al2O3 trapping dielectric for high-temperature applications Specht M, Reisinger H, Hofmann F, Schulz T, Landgraf E, Luyken RJ, Rosner W, Grieb M, Risch L Solid-State Electronics, 49(5), 716, 2005 |