검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Auger depth profile analysis and EFTEM analysis of annealed Ti/Al-contacts on Si-doped GaN Pidun M, Karduck P, Mayer J, Heime K, Schineller B, Walther T Applied Surface Science, 179(1-4), 213, 2001 |
| 2 |
Full field measurements of curvature using coherent gradient sensing : application to thin film characterization Rosakis AJ, Singh RP, Tsuji Y, Kolawa E, Moore NR Thin Solid Films, 325(1-2), 42, 1998 |