검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
A three-dimensional nonlinear analysis of electromigration-induced resistance change and Joule heating in microelectronic interconnects Kang SH, Shin E Solid-State Electronics, 45(2), 341, 2001 |
| No. | Article |
|---|---|
| 1 |
A three-dimensional nonlinear analysis of electromigration-induced resistance change and Joule heating in microelectronic interconnects Kang SH, Shin E Solid-State Electronics, 45(2), 341, 2001 |