화학공학소재연구정보센터
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No. Article
1 Ordered misfit dislocations in epitaxial Gd doped CeO2 thin films deposited on (001)YSZ single crystal substrates
Petrisor T, Meledin A, Boulle A, Mos RB, Gabor MS, Ciontea L, Petrisor T
Applied Surface Science, 433, 668, 2018
2 Misfit dislocation reduction in In GaAs epilayers grown on porous GaAs substrates
Dimitrakopulos GP, Bazioti C, Grym J, Gladkov P, Hulicius E, Pangrac J, Pacherova O, Komninou P
Applied Surface Science, 306, 89, 2014
3 Defect structure of epitaxial CrxV1-x thin films on MgO(001)
Kaspar TC, Bowden ME, Wang CM, Shutthanandan V, Manandhar S, van Ginhoven RM, Wirth BD, Kurtz RJ
Thin Solid Films, 550, 1, 2014
4 Atomistic modeling and HRTEM analysis of misfit dislocations in InN/GaN heterostructures
Kioseoglou J, Kalesaki E, Dimitrakopulos GP, Kehagias T, Komninou P, Karakostas T
Applied Surface Science, 260, 23, 2012
5 Edge misfit dislocations in the GeSi/Si(001) pair: Conditions and specific features of high-quantity generation
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov LV
Journal of Crystal Growth, 338(1), 12, 2012
6 Near-room temperature MWIR HgCdTe photodiodes limited by vacancies and dislocations related to Shockley-Read-Hall centres
Jozwikowski K, Kopytko M, Piotrowski J, Jozwikowska A, Orman Z, Rogalski A
Solid-State Electronics, 63(1), 8, 2011
7 Interpretation of the two-components observed in high resolution X-ray diffraction omega scan peaks for mosaic ZnO thin films grown on c-sapphire substrates using pulsed laser deposition
Durand O, Letoublon A, Rogers DJ, Teherani FH
Thin Solid Films, 519(19), 6369, 2011
8 Specific features of formation and propagation of 60 degrees and 90 degrees misfit dislocations in GexS1-x/Si films with x > 0.4
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov LV
Journal of Crystal Growth, 312(21), 3080, 2010
9 Stability of strained thin films with interface misfit dislocations A multiscale computational study
Pisutha-Arnond N, Yang B, Lim DH, Asta M, Thornton K
Thin Solid Films, 519(2), 809, 2010
10 Propagation of misfit dislocations from AlN/Si interface into Si
Liliental-Weber Z, Maltez RL, Xie J, Morkoc H
Journal of Crystal Growth, 310(17), 3917, 2008