검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
High order x-ray diffraction and internal atomic layer roughness of epitaxial and bulk SiC materials Xu G, Feng ZC Materials Science Forum, 338-3, 501, 2000 |
| No. | Article |
|---|---|
| 1 |
High order x-ray diffraction and internal atomic layer roughness of epitaxial and bulk SiC materials Xu G, Feng ZC Materials Science Forum, 338-3, 501, 2000 |